DIFRATTOMETRI

X-ray diffraction System  Maggiori dettagli...

APD2000

IPD3000

The IPD3000, Imaging Plate Diffractometer, is designed for a complete diffractometric analysis             without the need of any motor nor any electronic detector. The measurement is obtained by          means of imaging plates (they can be used thousands of times!), on which the diffracted rays            are revealed thanks to phosphors. A single complete diffractogram can be realised in few                 minutes! Imaging Plates are nearly ideal photon detectors that give you highest quality digital        images. They replace the old films and can be reused thousands of time. The collected images          can be read by the program MAUD. An high dynamic range and a great sensitivity of the             imaging plates ensure resolution and quality of the spectra! The Imaging Plate is a flexible             image sensor in which bunches of very small crystals (grain size: about 5 µm) of                           photo-stimulable phosphor of barium fluorobromide containing a trace amount of                           bivalent europium as a luminescence center, formulated as BaFBr: Eu2+, are uniformly coated                on a polyester support film.  Exposure of samples to the Imaging Plate is performed in a              manner similar to that of photo-film. The exposed Imaging Plate is scanned with a laser                  beam of red light while the plate is being conveyed with high accuracy in a phosphor reader.               The exposed Imaging Plate, while being conveyed, is scanned with a focused laser beam.                 The PSL released upon the laser is collected into the photomultiplier tube (PMT) through the             light collection guide and is converted to electric signals.

HRD3000

High Resolution X-ray Diffractometer.
The HRD 3000 high resolution diffraction system incorporates the most advanced digital              electronics, computers and Microsoft’s Windows 98/ME/2000/XP operating system. Exact               angular positions of the goniometer circles are guaranteed by a well-devised combination of               stepping motors and optical encoders. The goniometer circles are positioned at high speed.               The HRD 3000 diffractometer system can be used on a wide range of analytical problems, from               texture to thin film analysis, strain measurements and reflectometry. With this high                     performance, high resolution diffractometer, you can obtain outstanding results with amazing               ease, when determining layer thickness and composition in semiconductors. The high                  resolution reflectometry studies can be performed with the HRD 3000 to characterise layer               thickness, density, surface and interface roughness. Seven independent degrees of movement           freedom, allowing every possible sample position. The high efficiency of the various components permits analytical results of high quality.Different kind of source and optical components, several            detectors and special attachments can be added to meet all your requirements. You have the           choice of a large number easily mounted components. For more information on our system, attachments, and custom design accessories, contact us directly. Powerful, user-friendly                 software makes measurement easier than ever and includes many sophisticated features                     to aid in the interpretation of the results.

X-RED 3000

Multifunctional and Simultaneous Diffractometer System.
Many scientist are studying phase transitions of materials, in order to understand their                    properties. Other physical methods can be used, but only diffraction is able to provide                     information on the global structure of the compound. One common problem is the control,              during the acquisition time, of phase changes in the sample. Using X-RED 3000, from the                beginning of the run, the user can visualised the entire diffractogram, practically in real time.                so that a sample evolution is immediately visible. The X-RED 3000 offers solutions for a                   wide range of analytical problems, from routine qualitative and quantitative analysis, to                residual-stress analysis, non-ambient analyses, retained austenite quantification, crystallite             size/lattice strain and crystallinity calculations, phase transitions and transformations,                   kinetics & non-equilibrium phenomena.

STRESS-X 3000

Residual Stress X-ray Portable Diffractometer.
StressX-3000 is the latest portable X-ray diffraction system designed for the analysis of residual stress and the calculation of the percentage of retained austenite.
Residual stress is due to thermal treatments, mechanical processes, welding and surface treatments that the pieces undergo during the manufacturing processes. This type of stress permanently influences the piece's resistance, especially under strain, and often it is the cause of breaks that have no metallurgical justification.
The importance of residual stress analysis is growing. Welded structures, gears, shot-or sandblasted parts, thermal and many other treatments can be controlled and monitored with the help of X-Ray diffractometer. Reducing the data collection time is the next step, which this instrument is capable to offer.
Measurements of stresses in metals are made by using the distance between the atoms plans, as a stress gauge. The distance is measured with the help of the diffraction of an X-ray beam on the analysed part.
Even a small percentage of residual austenite (5%) can cause deformations that make the piece unusable. An example can be given with ball bearing tracks and injector pins for diesel motors. Detection of their presence can optimise thermal treatment